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Chuzhe Xiao, Norman C. Beaulieu. Node Switching Rates of Switch-and-Examine Relaying in Rician and Nakagami-m Fading. In European Wireless 2011, April 27-29, 2011, Vienna, Austria. VDE-Verlag, 2011. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Node Switching Rates of Opportunistic Relaying and Switch-and-Examine Relaying in Rician and Nakagami-m FadingChuzhe Xiao, Norman C. Beaulieu. tcom, 60(2):488-498, 2012. [doi] Node Switching Rates of Opportunistic Relaying in Rician and Nakagami-m FadingChuzhe Xiao, Norman C. Beaulieu. globecom 2011: 1-6 [doi]
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