Liyi Xiao, Jiaqiang Li, Jie Li, Jing Guo. Hardened design based on advanced orthogonal Latin code against two adjacent multiple bit upsets (MBUs) in memories. In Sixteenth International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA, March 2-4, 2015. pages 485-489, IEEE, 2015. [doi]
Abstract is missing.