Low-Cost Lithography Hotspot Detection with Active Entropy Sampling and Model Calibration - researchr publication authors

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Yifeng Xiao, Miaodi Su, Haoyu Yang, Jianli Chen, Jun Yu, Bei Yu 0001. Low-Cost Lithography Hotspot Detection with Active Entropy Sampling and Model Calibration. In 58th ACM/IEEE Design Automation Conference, DAC 2021, San Francisco, CA, USA, December 5-9, 2021. pages 907-912, IEEE, 2021. [doi]

This author has not been identified. Look up 'Yifeng Xiao' in GoogleThis author has not been identified. Look up 'Miaodi Su' in GoogleThis author has not been identified. Look up 'Haoyu Yang' in GoogleThis author has not been identified. Look up 'Jianli Chen' in GoogleThis author has not been identified. Look up 'Jun Yu' in GoogleThis author has not been identified. Look up 'Bei Yu 0001' in Google

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