BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks

Jie Xiao 0003, Zhanhui Shi, Xuhua Yang 0001, Jungang Lou. BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. IEEE Transactions on Computers, 71(5):1063-1076, 2022. [doi]

Authors

Jie Xiao 0003

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Zhanhui Shi

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Xuhua Yang 0001

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Jungang Lou

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