Jie Xiao 0003, Zhanhui Shi, Xuhua Yang 0001, Jungang Lou. BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. IEEE Transactions on Computers, 71(5):1063-1076, 2022. [doi]
@article{XiaoSYL22,
title = {BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks},
author = {Jie Xiao 0003 and Zhanhui Shi and Xuhua Yang 0001 and Jungang Lou},
year = {2022},
doi = {10.1109/TC.2021.3071253},
url = {https://doi.org/10.1109/TC.2021.3071253},
researchr = {https://researchr.org/publication/XiaoSYL22},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {71},
number = {5},
pages = {1063-1076},
}