BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks

Jie Xiao 0003, Zhanhui Shi, Xuhua Yang 0001, Jungang Lou. BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. IEEE Transactions on Computers, 71(5):1063-1076, 2022. [doi]

Abstract

Abstract is missing.