An ILD Void Detection Method for Monolithic 3-D ICs Based on Switched Capacitors

Ziwen Xiao, Zhiming Yang, Yang Yu 0015. An ILD Void Detection Method for Monolithic 3-D ICs Based on Switched Capacitors. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(8):2728-2737, 2023. [doi]

@article{XiaoY023,
  title = {An ILD Void Detection Method for Monolithic 3-D ICs Based on Switched Capacitors},
  author = {Ziwen Xiao and Zhiming Yang and Yang Yu 0015},
  year = {2023},
  doi = {10.1109/TCAD.2022.3226318},
  url = {https://doi.org/10.1109/TCAD.2022.3226318},
  researchr = {https://researchr.org/publication/XiaoY023},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {42},
  number = {8},
  pages = {2728-2737},
}