Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Cheng Xie, Yueyue Chen, Jianjun Chen, Jizuo Zhang. Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM. Science in China Series F: Information Sciences, 62(6):69402, 2019. [doi]

This author has not been identified. Look up 'Cheng Xie' in GoogleThis author has not been identified. Look up 'Yueyue Chen' in GoogleThis author has not been identified. Look up 'Jianjun Chen' in GoogleThis author has not been identified. Look up 'Jizuo Zhang' in Google

runs on WebDSL