Improvement of reverse conduction characteristic and single event effect for a novel vertical GaN field effect transistor with an integrated MOS-channel diode

Xintong Xie, Shuxiang Sun, Zhijia Zhao 0005, Pengfei Zhang, Jie Wei, Xin Zhou, Jingyu Shen, Jinpeng Qiu, Xiaorong Luo. Improvement of reverse conduction characteristic and single event effect for a novel vertical GaN field effect transistor with an integrated MOS-channel diode. Microelectronics Journal, 144:106091, February 2024. [doi]

Authors

Xintong Xie

This author has not been identified. Look up 'Xintong Xie' in Google

Shuxiang Sun

This author has not been identified. Look up 'Shuxiang Sun' in Google

Zhijia Zhao 0005

This author has not been identified. Look up 'Zhijia Zhao 0005' in Google

Pengfei Zhang

This author has not been identified. Look up 'Pengfei Zhang' in Google

Jie Wei

This author has not been identified. Look up 'Jie Wei' in Google

Xin Zhou

This author has not been identified. Look up 'Xin Zhou' in Google

Jingyu Shen

This author has not been identified. Look up 'Jingyu Shen' in Google

Jinpeng Qiu

This author has not been identified. Look up 'Jinpeng Qiu' in Google

Xiaorong Luo

This author has not been identified. Look up 'Xiaorong Luo' in Google