Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology

Yoni Xiong, Yueh Chiang, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva. Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]

@inproceedings{XiongCPBB23,
  title = {Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology},
  author = {Yoni Xiong and Yueh Chiang and Nicholas J. Pieper and Dennis R. Ball and Bharat L. Bhuva},
  year = {2023},
  doi = {10.1109/IRPS48203.2023.10117896},
  url = {https://doi.org/10.1109/IRPS48203.2023.10117896},
  researchr = {https://researchr.org/publication/XiongCPBB23},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
  publisher = {IEEE},
  isbn = {978-1-6654-5672-2},
}