Yoni Xiong, Yueh Chiang, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva. Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.