Statistical multilayer process space coverage for at-speed test

Jinjun Xiong, Yiyu Shi, Vladimir Zolotov, Chandu Visweswariah. Statistical multilayer process space coverage for at-speed test. In Proceedings of the 46th Design Automation Conference, DAC 2009, San Francisco, CA, USA, July 26-31, 2009. pages 340-345, ACM, 2009. [doi]

Abstract

Abstract is missing.