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Going Deeper with Deep Knowledge Tracing

Xiaolu Xiong, Siyuan Zhao, Eric Van Inwegen, Joseph Beck. Going Deeper with Deep Knowledge Tracing. In Tiffany Barnes, Min Chi, Mingyu Feng, editors, Proceedings of the 9th International Conference on Educational Data Mining, EDM 2016, Raleigh, North Carolina, USA, June 29 - July 2, 2016. pages 545-550, International Educational Data Mining Society (IEDMS), 2016. [doi]

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