Li Xu, Degang Chen. Accurate and efficient method of jitter and noise separation and its application to ADC testing. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-5, IEEE, 2014. [doi]
@inproceedings{XuC14-3, title = {Accurate and efficient method of jitter and noise separation and its application to ADC testing}, author = {Li Xu and Degang Chen}, year = {2014}, doi = {10.1109/VTS.2014.6818743}, url = {http://dx.doi.org/10.1109/VTS.2014.6818743}, researchr = {https://researchr.org/publication/XuC14-3}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014}, publisher = {IEEE}, }