Accurate and efficient method of jitter and noise separation and its application to ADC testing

Li Xu, Degang Chen. Accurate and efficient method of jitter and noise separation and its application to ADC testing. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-5, IEEE, 2014. [doi]

Abstract

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