Correction to "Analytical Thermal Model for Self-Heating in Advanced FinFET Devices With Implications for Design and Reliability" - researchr publication

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Chuan Xu, Seshadri K. Kolluri, Kazuhiko Endo, Kaustav Banerjee. Correction to "Analytical Thermal Model for Self-Heating in Advanced FinFET Devices With Implications for Design and Reliability". IEEE Trans. on CAD of Integrated Circuits and Systems, 39(1):277, 2020. [doi]

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