Yongjun Xu, Zuying Luo, Zhiguo Chen, Xiaowei Li. Average Leakage Current Macromodeling for Dual-Threshold Voltage Circuits. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 196-201, IEEE Computer Society, 2003. [doi]
Abstract is missing.