Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia. Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments. Microelectronics Journal, 143:106031, January 2024. [doi]
@article{XuLMSHWQX24,
title = {Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments},
author = {Hui Xu and Chaoming Liu and Ruijun Ma and Tai Song and Zhengfeng Huang and Jun Wang and Xuewei Qin and Yu Xia},
year = {2024},
month = {January},
doi = {10.1016/j.mejo.2023.106031},
url = {https://doi.org/10.1016/j.mejo.2023.106031},
researchr = {https://researchr.org/publication/XuLMSHWQX24},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {143},
pages = {106031},
}