Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments

Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia. Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments. Microelectronics Journal, 143:106031, January 2024. [doi]

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