Aibin Yan, Zhixing Li, Jie Cui 0004, Zhengfeng Huang, Tianming Ni, Patrick Girard 0001, Xiaoqing Wen. LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(6):2069-2073, June 2023. [doi]
Abstract is missing.