Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui 0004, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen. Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. In IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.