Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui 0004, Zhili Chen, Tianming Ni, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen. Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Trans. Emerging Topics Comput., 10(1):404-413, 2022. [doi]
Abstract is missing.