Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui 0004, Zhili Chen, Tianming Ni, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen. Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Trans. Emerging Topics Comput., 10(1):404-413, 2022. [doi]
@article{YanXFCCNHGW22,
title = {Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments},
author = {Aibin Yan and Zhelong Xu and Xiangfeng Feng and Jie Cui 0004 and Zhili Chen and Tianming Ni and Zhengfeng Huang and Patrick Girard 0001 and Xiaoqing Wen},
year = {2022},
doi = {10.1109/TETC.2020.3025584},
url = {https://doi.org/10.1109/TETC.2020.3025584},
researchr = {https://researchr.org/publication/YanXFCCNHGW22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Emerging Topics Comput.},
volume = {10},
number = {1},
pages = {404-413},
}