Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments

Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui 0004, Zhili Chen, Tianming Ni, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen. Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Trans. Emerging Topics Comput., 10(1):404-413, 2022. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.