Reliability-aware cross-point resistive memory design - researchr publication authors

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Cong Xu, Dimin Niu, Yang Zheng, Shimeng Yu, Yuan Xie. Reliability-aware cross-point resistive memory design. In Joseph R. Cavallaro, Tong Zhang 0002, Alex K. Jones, Hai Helen Li, editors, Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21 - 23, 2014. pages 145-150, ACM, 2014. [doi]

This author has not been identified. Look up 'Cong Xu' in GoogleThis author has not been identified. Look up 'Dimin Niu' in GoogleThis author has not been identified. Look up 'Yang Zheng' in GoogleThis author has not been identified. Look up 'Shimeng Yu' in GoogleThis author has not been identified. Look up 'Yuan Xie' in Google

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