Cong Xu, Dimin Niu, Yang Zheng, Shimeng Yu, Yuan Xie. Reliability-aware cross-point resistive memory design. In Joseph R. Cavallaro, Tong Zhang 0002, Alex K. Jones, Hai Helen Li, editors, Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21 - 23, 2014. pages 145-150, ACM, 2014. [doi]
No references recorded for this publication.
No citations of this publication recorded.