The combined effect of process variations and power supply noise on clock skew and jitter - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Hu Xu, Vasilis F. Pavlidis, Wayne Burleson, Giovanni De Micheli. The combined effect of process variations and power supply noise on clock skew and jitter. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 320-327, IEEE, 2012. [doi]

This author has not been identified. Look up 'Hu Xu' in GoogleThis author has not been identified. Look up 'Vasilis F. Pavlidis' in GoogleThis author has not been identified. Look up 'Wayne Burleson' in GoogleThis author has not been identified. Look up 'Giovanni De Micheli' in Google

runs on WebDSL