Hu Xu, Vasilis F. Pavlidis, Wayne Burleson, Giovanni De Micheli. The combined effect of process variations and power supply noise on clock skew and jitter. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 320-327, IEEE, 2012. [doi]
@inproceedings{XuPBM12,
title = {The combined effect of process variations and power supply noise on clock skew and jitter},
author = {Hu Xu and Vasilis F. Pavlidis and Wayne Burleson and Giovanni De Micheli},
year = {2012},
doi = {10.1109/ISQED.2012.6187512},
url = {http://dx.doi.org/10.1109/ISQED.2012.6187512},
researchr = {https://researchr.org/publication/XuPBM12},
cites = {0},
citedby = {0},
pages = {320-327},
booktitle = {Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012},
editor = {Keith A. Bowman and Kamesh V. Gadepally and Pallab Chatterjee and Mark M. Budnik and Lalitha Immaneni},
publisher = {IEEE},
isbn = {978-1-4673-1034-5},
}