Hu Xu, Vasilis F. Pavlidis, Wayne Burleson, Giovanni De Micheli. The combined effect of process variations and power supply noise on clock skew and jitter. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 320-327, IEEE, 2012. [doi]
Abstract is missing.