Flip-flop Selection to Maximize TDF Coverage with Partial Enhanced Scan

Gefu Xu, Adit D. Singh. Flip-flop Selection to Maximize TDF Coverage with Partial Enhanced Scan. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 335-340, IEEE, 2007. [doi]

Abstract

Abstract is missing.