Mechanical stability analysis of organic thin film transistors considering interfacial delamination - researchr publication authors

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Zhoulong Xu, Bo Tao, Zunxu Liu. Mechanical stability analysis of organic thin film transistors considering interfacial delamination. In 8th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2013, Suzhou, China, April 7-10, 2013. pages 973-977, IEEE, 2013. [doi]

This author has not been identified. Look up 'Zhoulong Xu' in GoogleThis author has not been identified. Look up 'Bo Tao' in GoogleThis author has not been identified. Look up 'Zunxu Liu' in Google

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