Zhoulong Xu, Bo Tao, Zunxu Liu. Mechanical stability analysis of organic thin film transistors considering interfacial delamination. In 8th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2013, Suzhou, China, April 7-10, 2013. pages 973-977, IEEE, 2013. [doi]
@inproceedings{XuTL13-3,
title = {Mechanical stability analysis of organic thin film transistors considering interfacial delamination},
author = {Zhoulong Xu and Bo Tao and Zunxu Liu},
year = {2013},
doi = {10.1109/NEMS.2013.6559885},
url = {http://dx.doi.org/10.1109/NEMS.2013.6559885},
researchr = {https://researchr.org/publication/XuTL13-3},
cites = {0},
citedby = {0},
pages = {973-977},
booktitle = {8th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2013, Suzhou, China, April 7-10, 2013},
publisher = {IEEE},
}