Hao Xu, Ranga Vemuri, Wen-Ben Jone. Run-time Active Leakage Reduction by power gating and reverse body biasing: An eNERGY vIEW. In 26th International Conference on Computer Design, ICCD 2008, 12-15 October 2008, Lake Tahoe, CA, USA, Proceedings. pages 618-625, IEEE, 2008. [doi]
Abstract is missing.