Determination of Thermal Conductivities for Thin-Film Materials in CMOS MEMS Process

Wei Xu, Xiaoyi Wang, Xiaojin Zhao, Yatao Yang, Yi-Kuen Lee. Determination of Thermal Conductivities for Thin-Film Materials in CMOS MEMS Process. IEEE T. Instrumentation and Measurement, 70:1-9, 2021. [doi]

@article{XuWZYL21,
  title = {Determination of Thermal Conductivities for Thin-Film Materials in CMOS MEMS Process},
  author = {Wei Xu and Xiaoyi Wang and Xiaojin Zhao and Yatao Yang and Yi-Kuen Lee},
  year = {2021},
  doi = {10.1109/TIM.2020.3029361},
  url = {https://doi.org/10.1109/TIM.2020.3029361},
  researchr = {https://researchr.org/publication/XuWZYL21},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {70},
  pages = {1-9},
}