A Time-Aware Fault Tolerance Scheme to Improve Reliability of Multilevel Phase-Change Memory in the Presence of Significant Resistance Drift

Wei Xu, Tong Zhang. A Time-Aware Fault Tolerance Scheme to Improve Reliability of Multilevel Phase-Change Memory in the Presence of Significant Resistance Drift. IEEE Trans. VLSI Syst., 19(8):1357-1367, 2011. [doi]

Abstract

Abstract is missing.