Full-Time Junction Temperature Extraction of IGCT Based on Electrothermal Model and TSEP Method for High-Power Applications - researchr publication authors

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Chaoqun Xu, Biao Zhao, Xiangyu Zhang 0004, Zhengyu Chen, Jiapeng Liu, Wenpeng Zhou, Zhanqing Yu, Rong Zeng. Full-Time Junction Temperature Extraction of IGCT Based on Electrothermal Model and TSEP Method for High-Power Applications. IEEE Transactions on Industrial Electronics, 68(1):47-58, 2021. [doi]

This author has not been identified. Look up 'Chaoqun Xu' in GoogleThis author has not been identified. Look up 'Biao Zhao' in GoogleThis author has not been identified. Look up 'Xiangyu Zhang 0004' in GoogleThis author has not been identified. Look up 'Zhengyu Chen' in GoogleThis author has not been identified. Look up 'Jiapeng Liu' in GoogleThis author has not been identified. Look up 'Wenpeng Zhou' in GoogleThis author has not been identified. Look up 'Zhanqing Yu' in GoogleThis author has not been identified. Look up 'Rong Zeng' in Google

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