Full-Time Junction Temperature Extraction of IGCT Based on Electrothermal Model and TSEP Method for High-Power Applications

Chaoqun Xu, Biao Zhao, Xiangyu Zhang 0004, Zhengyu Chen, Jiapeng Liu, Wenpeng Zhou, Zhanqing Yu, Rong Zeng. Full-Time Junction Temperature Extraction of IGCT Based on Electrothermal Model and TSEP Method for High-Power Applications. IEEE Transactions on Industrial Electronics, 68(1):47-58, 2021. [doi]

Abstract

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