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A one-pass test-selection method for maximizing test coverage

Cheng Xue, R. D. (Shawn) Blanton. A one-pass test-selection method for maximizing test coverage. In 33rd IEEE International Conference on Computer Design, ICCD 2015, New York City, NY, USA, October 18-21, 2015. pages 621-628, IEEE Computer Society, 2015. [doi]

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Cheng Xue

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R. D. (Shawn) Blanton

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