Cheng Xue, R. D. (Shawn) Blanton. A one-pass test-selection method for maximizing test coverage. In 33rd IEEE International Conference on Computer Design, ICCD 2015, New York City, NY, USA, October 18-21, 2015. pages 621-628, IEEE Computer Society, 2015. [doi]
@inproceedings{XueB15-1, title = {A one-pass test-selection method for maximizing test coverage}, author = {Cheng Xue and R. D. (Shawn) Blanton}, year = {2015}, doi = {10.1109/ICCD.2015.7357173}, url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2015.7357173}, researchr = {https://researchr.org/publication/XueB15-1}, cites = {0}, citedby = {0}, pages = {621-628}, booktitle = {33rd IEEE International Conference on Computer Design, ICCD 2015, New York City, NY, USA, October 18-21, 2015}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-7166-7}, }