Probability Analysis for CMOS Floating Gate Faults

Hua Xue, Chennian Di, Jochen A. G. Jess. Probability Analysis for CMOS Floating Gate Faults. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 443-448, IEEE Computer Society, 1994.

@inproceedings{XueDJ94,
  title = {Probability Analysis for CMOS Floating Gate Faults},
  author = {Hua Xue and Chennian Di and Jochen A. G. Jess},
  year = {1994},
  tags = {analysis},
  researchr = {https://researchr.org/publication/XueDJ94},
  cites = {0},
  citedby = {0},
  pages = {443-448},
  booktitle = {EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France},
  editor = {Robert Werner},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-5410-4},
}