Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, LetÃcia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui. Characterization and Test of Intermittent Over RESET in RRAMs. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.