Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui. Device-Aware Test for Ion Depletion Defects in RRAMs. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 246-255, IEEE, 2023. [doi]
Abstract is missing.