A New Sensitivity-Driven Process Variation Aware Self-Repairing Low-Power SRAM Design - researchr publication

researchr

You are not signed in
Sign in
Sign up

Nandakishor Yadav, Sunil Dutt, G. K. Sharma. A New Sensitivity-Driven Process Variation Aware Self-Repairing Low-Power SRAM Design. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014. pages 116-121, IEEE, 2014. [doi]

Abstract is missing.

runs on WebDSL