A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM - researchr publication authors

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Nandakishor Yadav, Shikha Jain, Manisha Pattanaik, G. K. Sharma. A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM. Microelectronics Reliability, 55(8):1131-1143, 2015. [doi]

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