Nandakishor Yadav, Shikha Jain, Manisha Pattanaik, G. K. Sharma. A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM. Microelectronics Reliability, 55(8):1131-1143, 2015. [doi]
@article{YadavJPS15,
title = {A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM},
author = {Nandakishor Yadav and Shikha Jain and Manisha Pattanaik and G. K. Sharma},
year = {2015},
doi = {10.1016/j.microrel.2015.05.014},
url = {http://dx.doi.org/10.1016/j.microrel.2015.05.014},
researchr = {https://researchr.org/publication/YadavJPS15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {8},
pages = {1131-1143},
}