Nandakishor Yadav, Shikha Jain, Manisha Pattanaik, G. K. Sharma. A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM. Microelectronics Reliability, 55(8):1131-1143, 2015. [doi]
@article{YadavJPS15, title = {A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM}, author = {Nandakishor Yadav and Shikha Jain and Manisha Pattanaik and G. K. Sharma}, year = {2015}, doi = {10.1016/j.microrel.2015.05.014}, url = {http://dx.doi.org/10.1016/j.microrel.2015.05.014}, researchr = {https://researchr.org/publication/YadavJPS15}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {55}, number = {8}, pages = {1131-1143}, }