A novel technique to measure data retention voltage of large SRAM arrays

Farah B. Yahya, Mohammad Mansour, Ali Chehab. A novel technique to measure data retention voltage of large SRAM arrays. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 65-68, IEEE, 2011. [doi]

Abstract

Abstract is missing.