COM (Cost Oriented Memory) Testing

T. Yamada, Akihiro Fujiwara, Michiko Inoue. COM (Cost Oriented Memory) Testing. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 259, IEEE Computer Society, 1992.

Authors

T. Yamada

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Akihiro Fujiwara

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Michiko Inoue

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