T. Yamada, Akihiro Fujiwara, Michiko Inoue. COM (Cost Oriented Memory) Testing. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 259, IEEE Computer Society, 1992.
@inproceedings{YamadaFI92,
title = {COM (Cost Oriented Memory) Testing},
author = {T. Yamada and Akihiro Fujiwara and Michiko Inoue},
year = {1992},
tags = {testing},
researchr = {https://researchr.org/publication/YamadaFI92},
cites = {0},
citedby = {0},
pages = {259},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}