Teruhiko Yamada, Tsuneto Hanashima, Yasuhiro Suemori, Masaaki Maezawa. On Testing of Josephson Logic Circuits Consisting of RSFQ Dual-Rail Logic Gates. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 222-227, IEEE Computer Society, 1998. [doi]
Abstract is missing.