Automatic System Level Test Generation and Fault Location for Large Digital Systems - researchr publication authors

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Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu. Automatic System Level Test Generation and Fault Location for Large Digital Systems. In Stephen A. Szygenda, editor, Proceedings of the 15th Design Automation Conference, DAC '78, Las Vegas, Nevada, USA, June 19-21, 1978. pages 347-352, ACM, 1978. [doi]

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